On January 26, 2021 the participants of the MSc program Engineering Management had a virtual excursion to the IFT Metrology Laboratory of TUWien. After the lecture “Metrology and Total Quality Management” by Prof. Numan Durakbasa, we had the opportunity to got an overview on different “high tech” measurement devices.

First a 3D coordinate measuring machine, was explored with a complex dimensional work piece being geometrically measured on its surface. Next an optical 3D micro coordinate measurement system allowed us to visualize the formation and texture of a milling tool and coin placed under six distinctive lenses on the 360° turning table. Very interesting was an Atomic Force Microscope for measurements in Nanoscale and a Charge Coupled Device Camera which commonly utilized for determining materials at micrometric and nanometric levels to identify its structure and properties.

Many thanks to Prof. Durakbasa and Mrs. Walcher for this impressive virtual excursion based on a real-life experience of various measurement methods on different devices under a robust environment.

Report by:
Sujoung (South Korea),
Felix (Austria),
Sonja (Germany)
Jens (India)