The laboratory infrastructure of the research unit “Materials Science” (E308-01) has been developed and continuously expanded since 2012 as part of the professorial appointment of Univ.Prof. Paul H. Mayrhofer. It combines institutional start-up support from TU Wien with substantial third-party funding, including his FWF-START Prize Atomistic study of metastable phases, opens an external URL in a new window and his CD Laboratory AOCD Application Oriented Coating Development, opens an external URL in a new window

Operation and maintenance are coordinated by the research unit E308-01 in close cooperation with affiliated groups actively using the infrastructure. Research access is granted within structured collaborations based on project agreements. For questions regarding access or collaboration, please contact Univ.Prof. Paul Mayrhofer directly.

PVD Systems

AJA Orion 5 – Angie

[Translate to English:] AJA Orion 5 (Angie)

© E308-01

UHV DC/RF magnetron sputtering with 3 confocal cathodes (1x3'', 2x2''), substrate heating up to 700 °C, and Ar, N2, O2 gases.

Z400 – Ylvi

[Translate to English:] Z400 (YLVI)

© E308-01

DC/RF magnetron sputtering, one 3" cathode, substrate heating to 650 °C, Ar, N2, and O2 gases.

Noreia

[Translate to English:] Noreia

© E308-01

HiPIMS system, 4 confocal cathodes (2x3'', 2x6''), substrate heating to 600 °C, Ar, N2, and O2 gases.

Frida

[Translate to English:] Frida

© E308-01

HiPIMS system, one 3" cathode, substrate heating to 650 °C, Ar, N2, O2, and C2H2 gases. (third party funds by E308-01-1 and E308-01-2)

Thermal Analyses

STA 449 F1 Jupiter – Daisy

[Translate to English:] STA 449 F1 Jupiter – Daisy

© E308-01

Netzsch STA 449 F1 Jupiter, combining DSC and TGA, with 2 ovens (1600 °C and 2400 °C (vacuum)).

kSA-MOS-T-Scan – Kate

[Translate to English:] kSA-MOS-T-Scan – Kate

© E308-01

Wafer curvature measurement kSA MOS (Multi-beam Optical Sensor) ThermalScan Systems (MOS-TS300-HAT; linear scan up to 300 mm, RT–1000 °C, 10 K/s, passive cooling, vacuum). Financed and operated jointly with the research unit E366-02 as part of an interfaculty infrastructure collaboration at TU Wien.

HT-Vacuum Oven – Senta

[Translate to English:] HT-Vacuum Oven – Senta

© E308-01

Centorr LF22-2000 vacuum furnace, Mo-shielding, max. 1600 °C, Ar, N2, vacuum, heating rate 50 K/min, passive cooling.

Mechanical Characterization

UMIS2 Nanoindenter – Fedora

[Translate to English:] UMIS2 Nanoindentor – Fedora

© E308-01

CSIRO UMIS with Berkovich or Cube corner, dual force range 0–50 mN, 0–500 mN, dual displacement range 0–2 µm, 0–20 µm.

FT-I04 Femto-Indenter – Eve

[Translate to English:] FT-I04 Femto-Indenter

© E308-01

Nanoindenter with continuous stiffness measurement, 0.5 nN–200 mN, position 50 pm–20 µm (fine) or 40 mm (coarse), 130x130 mm 6 sample stage, high-speed mapping, fatigue testing. (jointly financed by E308-01-1, E308-01-2, E308-02-2, E308-03-1, and E308-03-2).

FT-NMT04-XYZ in-situ SEM Femto-Nanoindenter – Wall⋅e

[Translate to English:] FT-NMT04-XYZ in-situ SEM Femto-Nanoindenter

© E308-01

Nanomechanical testing in SEM, force 0.5 nN–200 mN, position 50 pm–21 mm, compression/tensile, dynamic fracture, nanoindentation and fatigue. (jointly financed by E308-01-1, E308-01-2, E308-03-1, and E308-03-2).

Tribology and Wear

Nanovea Tribometer – Trixi

[Translate to English:] Nanovea Tribometer – Trixi

© E308-01

Disc holder 0.01–2000 rpm, sensor 20 N, weights 1, 2, 5, 10 N, liquid cup holder, heater to 900 °C sample temp. 

Nanovea Profilometer – Luxi

[Translate to English:] Nanovea Profilometer – Luxi

© E308-01

3D Non-Contact white light profiler, 50 mm translation, 18 mm/s, CCS Prima sensor with up to 2 kHz data acquisition.

Calowear

[Translate to English:] Calowear

© E308-01

Coating-thickness measurements of 0.3–30 µm (error of 1–5 %) via grinded calottes of diameter 0.1–2 mm using ball diameter 15–30 mm.

Services

Sand Blaster – Emma

[Translate to English:] Sand Blaster – Emma

© E308-01

Light Optical Microscope

[Translate to English:] Light Optical Microscope

© E308-01

3D – Printer

[Translate to English:] 3D – Printer

© E308-01

Microstructure and Chemistry

In addition to these specific infrastructure of the Materials Science Division, details on microstructure and chemistry are obtained by scanning electron microscopy (SEM), energy and wavelength dispersive X-ray spectrometry (EDS and WDS), and X-ray diffraction. Some of the needed instruments are available at the Institute directly (such as the Zeiss Sigma 500 VP SEM, to which the TEXS HP (Transition Element X-ray Spectrometer – High Precision) WDS system is attached as well as the in-situ SEM Femto-Nanoindenter). Further details are obtained with the help of the Core Shared Research Facilities of TU Wien, such as the Analytical Instrumentation Center (AIC), University Service Facility for Transmission Electron Microscopy (USTEM), and X-ray Center (XRC).