Zeiss Evo 10 scanning electron microscope

© E308

Manufacturer: Zeiss Model: Evo 10

Description: Classic scanning electron microscope with tungsten cathode, connected energy-dispersive microanalysis system (Zeiss Smart EDX), medium-sized sample chamber, operation with variable pressure.

Purpose: Examination of fracture surfaces, functional surfaces, structures at high magnification. Micro-Area Analysis Technical specifications: Detectors: SE, BSE, EDX Magnifications infinitely variable up to approx. 300,000x Theoretically, resolving power approx. 5 nm Standardless microanalysis Elements from atomic number 5 (boron) Resolution about 130 eV

Zeiss Sigma 500 VP scanning electron microscope

© E308

Manufacturer: Zeiss Model: Sigma 500 VO

Description: High-resolution scanning electron microscope with field emission source, large sample chamber, connected energy-dispersive microanalysis system (EDAX)

Purpose: Examination of fracture surfaces, functional surfaces, structures at high magnification.

Micro-Area Analysis

Technical specifications:
Detectors: SE, BSE, EDX, EBSD, STEM Magnifications infinitely variable up to approx. 1000000x
Theoretically, the resolving power is approx. 0.9 nm Standardless microanalysis Elements from atomic number 5 (boron) Resolution about 130 eV

Scanning electron microscope with EDX

© E308

Manufacturer: FEI Philips Model: XL 30

Description: Classic high vacuum with large sample chamber, scanning electron microscope with connected energy-dispersive microanalysis system (EDAX) Purpose: Examination of fracture surfaces, functional surfaces, structures at high magnification.

Micro-Area Analysis

Technical specifications:
Detectors: SE, BSE, EDX Magnifications infinitely variable up to approx. 100,000x
Theoretically, resolving power approx. 5 nm
Standardless microanalysis Elements from atomic number 5 (boron)
Resolution about 130 eV

Light microscope Zeiss Axiomager

© E308

Manufacturer: Zeiss Model: AxioImager.M2m

Description: Metal microscope with digital camera and attached image analysis system.

Intended use: examination of metallographic samples, structural examination, structural analysis.

Technical data:
Magnifications: eyepiece 10x / lenses 1.25x 2.5x 5x 10x 20x 50x,100x
Contrasting: bright field, dark field, polarization, differential interference contrast.

Light microscope Zeiss Axioplan

© E308

Manufacturer: Zeiss Model: Axioplan

Description: Metal microscope with digital camera and attached image analysis system.

Intended use: examination of metallographic samples, structural examination, structural analysis.

Technical data:
Magnifications: eyepiece 10x / lenses 1.25x 2.5x 10x 20x 50x,100x
Contrasting: bright field, dark field, differential interference contrast.

Manufacturer: Zeiss Model: Axiolab

Description: Incident light microscope with digital camera.

Intended use: Examination of ground samples.

Technical data:
Magnifications: eyepiece 10x / lenses 5x 10x 20x 50x,100x
Contrasts: brightfield

Light microscope Zeiss

© E308

Manufacturer: Zeiss

Description: Metal microscope in overthrown design.

Intended use: examination of metallographic samples, structural examination, structural analysis.

Technical data:
Magnifications: eyepiece 12.5x / lenses 4x 8x 16x 40x 80x
Contrasting: bright field, dark field, interference contrast.

Stereomicroscope wild

© E308

Manufacturer: Wild Model: M 8

Description: Stereo microscope with ring light and digital camera

Intended use: Stereomicroscopic observation of surfaces

Technical data: Magnification infinitely variable (zoom) 6x to 50x, additional lenses 0.4x and 1.6x

digital microscope

© E308

Manufacturer: Keyence Model: VHX6000

Reflected light, transmitted light Zoom optics with magnifications from 5x to 1000x (based on a 15" screen)
Depth of Field Image Capture, Panoramic Images, 3D Image Composites, various measuring functions: profile, roughness, ...

Nikon measuring microscope

© E308

Manufacturer: Nikon Model: Measurescope MM-22

Description: Measuring microscope with reflected and transmitted light illumination and motorized X/Y coordinate table

Purpose: Optical, non-contact length measurement

Technical data: Magnification 50x Infeed accuracy coordinate table 1 µm

Atomic Force Microscope

© E308

The ATOMIC FORCE MICROSCOPE XE7 from Parks has all the state-of-the-art technology and yet, simple equipment used for the study of morphological, topographical, electrical, magnetic, nanomechanical properties of the materials. The flat, orthogonal, and linear scan measurements, as well as the unique design of XE7, which includes separate XY and Z scanners, assist in the obtaining high resolution sample images and the characteristic measurements true to its nanostructure.

XE7 is located at the main building of TU Vienna in the Interfacultary Laboratory for Micro- and Nanomechanics of Biological and Biomimetical Materials.

Technical specification

  • XY Scanner: Single-module flexure XY scanner with closed-loop control
  • Z Scanner: Guided high-force Z scanner
  • Sample Diameter: Up to 100 mm
  • Thickness: Up to 20 mm
  • AFM Modes: True Non-Contact AFM, Basic Contact AFM, Lateral Force Microscopy (LFM), Phase Imaging and Intermittent (tapping) AFM

Manufacturer: Zeiss Model: Stemi 2000-C

Description: Stereo microscope

Intended use: Stereomicroscopic observation of surfaces

Specifications: Magnification: 10x to 50x

Manufacturer: Bruker Model: Hyperion 1000

Description: Basic infrared microscope with transmission and reflection modes and transparent cutting edge diaphragm

Intended Use: Sample characterization, product control and development

 

The LSM 800 is a confocal laser scanning microscope from Zeiss based on an inverted Observer Z1. The inverted configuration is designed for imaging both live cells and fixed samples. The device available at IMST is equipped with an incubator for temperature and CO2 control. It is able to run multidimensional experiments including multichannel acquisition, z-stacks, tile scanning, and time-lapse. Our LSM800 is equipped with 4 laser lines, as well as detectors for both fluorescence signals and transmitted light DIC. For specialized experiments an Airyscan GaAsP detector can be used in order to improve the spatial resolution and signal to noise ratio.

Technical specification

  • Detectors: Two GaASP detectors, Airyscan
  • Laser Lines: 405, 488, 561, 633 nm.  
  • Objectives: 2,5x, 10x, 40x (water)