Location

room number: ZE U1 24A, opens an external URL in a new window
Tel.: +43(0)1 58801 45204

JEOL NeoARM 200F (advert. image - (c) JEOL )

[Translate to English:] Jeol NeoARM 200F

The double-corrected JEOL NeoARM 200F will be installed in June 2026. The advantages over the two TECNAI TEMs (F20 and G20) are the correction of the spherical aberration of the condenser lens to achieve true atomic resolution in STEM mode, as well as the correction of the spherical aberration of the objective lens, which will allow atomic resolution videos in in-situ experiments in TEM mode.

Emitter: C-FEG
Beam voltage: 20kV, 60 kV, 200 kV
Cs-correction for STEM: CEOS ASCOR, opens an external URL in a new window
Cs-correction for TEM: CEOS ATCOR, opens an external URL in a new window
STEM: BF, ABF, DF, HAADF, DPC, SE
Electron dose modulator: yes
Camera: yes
EELS/EFTEM: yes
EDX: JEOL Dual-EDX System 200

lattice resolution: 0.07 nm
point resolution TEM: 0.12 nm (@200kV)
point resolution TEM: 0.17 nm (@60kV)
point resolution STEM: 0.078 nm (@200 kV)
point resolution STEM: 0.118 nm (@60 kV)

energy resolution: 0.3 eV (@200 kV)
energy resolution: 0.3 eV (@60 kV)
energy resolution: 0.3 eV (@20 kV)
energy resolution EDX: \(\leq\)129 eV

imaging TEM/STEM/HRTEM
electron diffraction
EMCD-experiments
semiconductor research (VEELS)
Low Voltage (20 keV) EELS
research cooperations
chemical micro-analysis with atomic resolution
Catalysis research, opens an external URL in a new window

single tilt holder
analytical double tilt holder
tomography holder