Fields of research

For many years, the main activities of the Scanning Probe Microscopy group were in the field of Ballistic Electron Microscopy (BEEM) on semiconductor nanostructures. Review articles on these activities are listed below. More recent work has been devoted to the fields of Scanning Capacitance Microscopy (SCM) and Scanning Microwave Microscopy (SMM). Publications can be found in our list of publications.

Reviev articles on  BEEM and electron transport in nanostructures

• J.Smoliner, D.Rakoczy, M.Kast, Hot Electron Spectroscopy / Microscopy,Rep. Prog. Phys. 1863-1914, (2004)
• J.Smoliner, G.Ploner, Electron transport and confining potentials in nanostructures, Handbook of Nanostructured Materials and Nanotechnology, Vol.3, p1-91, ed. H.Nalwa, Academic Press (2000)
• J.Smoliner, Tunneling spectroscopy of low dimensional states, Semiconductor Science and Technology, 11, 1, (1996)

During the last few years I have spent more of my time teaching and writing and translating textbooks: 

Textbooks on the basics of semiconductor physics and semiconductor devices (in German language only)

• Grundlagen der Halbleiterphysik I: Das Skriptum  in Buchform bei Springer (kostenfrei im TUNET!)
• Grundlagen der Halbleiterphysik II: Das Skriptum in Buchform bei Springer (kostenfrei im TUNET!)I
• S.M.Sze, Physik der Halbleiterbauelemente (Deutsche Übersetzung der 4ten Auflage von S.M.Sze, Physics of Semiconductor Devices)