Topographic AFM image

Larger (left) and nanoscopic (right) material deposits on a smooth surface. The image was generated with an AFM image processing software.

Fields of research

For many years, the main activities of the Scanning Probe Microscopy group were in the field of Ballistic Electron Microscopy (BEEM) on semiconductor nanostructures. Review articles on these activities are listed below. More recent work has been devoted to the fields of Scanning Capacitance Microscopy (SCM) and Scanning Microwave Microscopy (SMM). Publications can be found in our list of publications.

Reviev articles on  BEEM and electron transport in nanostructures

During the last few years I have spent more of my time teaching and writing and translating textbooks: 

Textbooks on the basics of semiconductor physics and semiconductor devices (in German language only)