A platform for scanning probe techniques invented at the TU Wien eliminates thermal drift and enables exact positional clamping in 3 spacial and 2 rotational directions. The new, modular measuring apparatus for probe microscopy allows absolute positioning for scanning probe devices and general sample positioning, that could also be applied to semi-conductor processing equipment positioning. Numerous advantages of this invention include online and real-time drift compensation, nanometre accuracy, long term stabilisation over hours, and implementation into various complementary platforms.