© Tiss: Michael Waltl

Univ.Prof. Dipl.-Ing. Dr.techn.  Michael Waltl was appointed as University Professor for “Robust Microelectronics” at TU Wien with effect fom March 1, 2024. He is assigned to the Institute for Microelectronics, opens an external URL in a new window (E360) at the Faculty of Electrical Engineering and Information Technology, opens in new window.

Michael Waltl comes from Upper Austria. He studied electrical engineering at the TU Wien (with distinction) and received his doctorate there in 2016 with his dissertation (summa cum laude) on the subject of "Experimental characterization of bias temperature instabilities in modern transistor technologies, opens an external URL in a new window". He then remained connected to the TU Wien first as a senior scientist, then as Associate Prof. In addition to numerous FFG and projects financed directly by industry, in 2018 he was able to acquire the CD laboratory for single defect spectroscopy in semiconductor components, opens an external URL in a new window with industrial partners such as ams OSRAM AG, Global TCAD Solutions GmbH and Infineon Technologies Austria AG. Michael Waltl is part of the management committee of renowned international IEEE conferences such as the IIRW, opens an external URL in a new window (International Integrated Reliability Workshop) and serves on the technical program committee of the IEDM, IRPS, ESSDERC and ESREF. He is also Associate Editor of the Microelectronics Engineering Journal.

The scientific home of Michael Waltl is the aforementioned institute, where he is currently dealing with research questions relating to the robustness of electronic components and circuits.

Publications by Michael Waltl in the database Scopus, opens an external URL in a new window and in ReposiTUm, opens an external URL in a new window

[Website Michael Waltl, opens an external URL in a new window]