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29. June 2018
Best Paper Award at IEEE Smart SysTech 2018
Shrief Rizkalla received the best paper award at the IEEE Smart SysTech conference
Shrief Rizkalla receives the certificate of the best paper award from Gerd vom Böge Open Image Gallery
Shrief Rizkalla receives the certificate of the best paper award from Gerd vom Bögel (Fraunhofer IMS, Germany)
Best Paper Certificate Open Image Gallery
Best Paper Certificate

Shrief Rizkalla received the best paper award at the IEEE Smart SysTech conference, the European Conference on Smart Objects, Systems and Technologies, Dresden, Germany, June 12-13, 2018.

His paper is entitled “HF RFID Card Optimization Regarding the IC’s Non-Linearity” and co-authored by Ralph Prestros (Customer RF Expert, NXP Semiconductors Austria GmbH) and Christoph Mecklenbräuker.

This work is the result of a research cooperation between NXP Semiconductors Austria GmbH located in Gratkorn (Styria) and the institute of telecommunications.

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