Information on Expertise, Publications & Teaching

Expertise

Surface analysis using scanning probe microscopy (AFM, STM) and electron microscopy/electron beam microanalysis (REM/EDX) in various fields of application (materials, biological samples, nanoparticles, environmental samples, medicine, etc.).

Publications

An overview of my publications can be found in CatalogPlus (TU Vienna Library), opens an external URL in a new window.

Teaching

 You can find my current courses on TISS, opens an external URL in a new window (TU Vienna).