DektakXT® Stylus Surface Profiler
The DektakXT® stylus surface profiler is a state-of-the-art instrument equipped with complete measurement and analysis software (Vision64). It can measure layer thicknesses and step heights of thin and thick layer samples. The DektakXT® system is also capable of measuring the topography and waviness, as well as the roughness of a surface down to the nanometer (nm) range. In addition to the measurements of two-dimensional surface profiles, three-dimensional analyses can also be performed.
The DektakXT® stylus surface profiler performs electromechanical measurements by moving the stylus with a diamond tip over the specimen surface. The user can individually select the stylus's scan length, speed and stylus force. The stylus is connected to a linear variable differential transformer (LVDT), which generates and processes electrical signals corresponding to the surface changes of the sample. After conversion to a digital format, the measured surface changes are displayed and can be characterized and evaluated using the included software package "Vision64".
Find more information on the manufacturer's website, www.bruker.com/en.html, opens an external URL in a new window.