[Translate to English:] Forscherin am Elektronenmikroskop

Facilities

Transmission Electron Microscopes (TEM)

Fieldemission-TEM with EDX, EELS, HAADF, CL 
available high tensions: 60 keV, 200 keV

LaB6-TEM with EDX, EELS, STEM, CL
available high-tensions: 10-100 keV, 120 keV, 200 keV

Scanning Electron Microscopes (SEM)

Fieldemission-scanning electron microscope with EDX, EBSD, STEM, TKD, environmental mode, NavCam

Focused Ion Beam (FIB)

FIB with EDX, EBSD, cryo-stage, Kleindiek NanoManipulator

Fieldemission-SEM and FIB for precise and fast TEM-saple preparation and nano-factoring