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A new Dr.in tech. is "born"

Ze Scales has been awarded a doctorate following the successful completion of her oral examination on the topic of "Characterization of electronically distinct dislocations in Carbon doped GaN: a pathway of analytical techniques".

Dr. Ze Scales and Dr. Michael Stöger-Pollach

Ze Scales successfully completed her PhD under the supervision of Dr Michael Stöger-Pollach from USTEM and Dr Michael Reisinger from KAI – a centre of excellence at Infineon Austria. Her outstanding work will help to make high-performance semiconductors even more robust. To this end, the characterisation of electrically active crystal dislocations is of crucial importance: if we can understand how these can be avoided during the manufacturing process, the service life and reliability can be significantly increased.